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High performance raster scanning of atomic force microscopy using Model-free Repetitive Control
- Li, Linlin, Fleming, Andrew J., Yong, Yuen K., Aphale, Sumeet S., Zhu, LiMin
- Zhang, Hai-Tao, Hu, Bo, Li, Linlin, Chen, Zhiyong, Wu, Dongrui, Xu, Bowen, Huang, Xiang, Gu, Guoying, Yuan, Ye
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